The profile fitting in single-crystal X-ray diffractometry

نویسندگان

چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

A Fundamental Parameters Approach to X-ray Line-Profile Fitting

A convolution approach to X-ray powder line-profile fitting is developed in which the line shape is synthesized from the Cu Ks emission profile, the dimensions of the diffractometer and the physical variables of the specimen. In addition to the integrated intensities and 20 positions of the line profiles, the parameters that may be fitted include the receiving-slit width, the receiving-slit len...

متن کامل

Single Crystal Diamond X-ray Lens Development

The next generation light sources such as diffractionlimited storage rings and high repetition rate free electron lasers (FELs) will generate x-ray beams with significantly increased peak and average brilliance. These future facilities will require x-ray optical components capable of handling large instantaneous and average power densities while tailoring the properties of the x-ray beams for a...

متن کامل

X-ray diffractometry for the structure determination of a submicrometre single powder grain

A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale sing...

متن کامل

The Development of a Full Profile Analysis of Single-crystal X-ray Diffraction Data

The best way to determine the true intensities of diffraction spots is by use of profile analysis. Area-detector diffractometers yield three-dimensional profiles. It is argued that the best way to handle these is by expansion in terms of Weber-Hermite functions. I PROFILE FITTING. It has long been known that the determination of diffraction spot intensities can be improved markedly if use is ma...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography

سال: 1993

ISSN: 0108-7673

DOI: 10.1107/s0108767378098517